Analytical Sciences

Improvement of Detection Limits for Particle Contamination by Confocal Configuration in X-Ray Fluorescence Microscope

Hitomi NAKANO,*,** Shintaro KOMATANI,* Tsugufumi MATSUYAMA,** and Kouichi TSUJI**

*HORIBA TECHNO SERVICE Co., Ltd., Analytical Technology Department, 2 Kisshoin-Miyanohigashi-cho, Minami, Kyoto 601-8305, Japan
**Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto-cho, Sumiyoshi, Osaka 558-8585, Japan

Micro X-ray fluorescence (XRF) enables the non-destructive analysis of particle contamination. In this study, we compared the detection sensitivities and the LLD (lower limit of detection) values of micro-metallic particle contaminations on the plastic detected by micro-XRF and confocal micro-XRF. First, to verify the effectiveness of the confocal micro-XRF, we compared the intensities of different shaping copper samples (plate, thin film and particle). The results demonstrated that confocal micro-XRF is more effective than micro-XRF for the detection of micro particles. Second, to compare the SN ratios of different X-ray energies, several micro-metallic particles (Si, Fe, and Cu) set on an acrylic plate were measured by micro-XRF and confocal micro-XRF. It was found that the SN ratios of the confocal micro-XRF when measuring the Si, Fe, and Cu particles were improved to be approximately 14.6, 21.9, and 43.5-times those of the micro-XRF, respectively. It was determined that confocal micro-XRF is more effective for micro-metallic particles in the higher energy region.

J-STAGE: View this article in J-STAGE