Analytical Sciences

Abstract − Analytical Sciences, 32(2), 225 (2016).

Diagnosis of Periodontal Disease from Saliva Samples Using Fourier Transform Infrared Microscopy Coupled with Partial Least Squares Discriminant Analysis
Satoshi FUJII,*1,*2 Shinobu SATO,*2,*3 Keisuke FUKUDA,*2 Toshinori OKINAGA,*4 Wataru ARIYOSHI,*4 Michihiko USUI,*5 Keisuke NAKASHIMA,*5 Tatsuji NISHIHARA,*4 and Shigeori TAKENAKA*2,*3
*1 Department of Bioscience and Bioinformatics, Kyushu Institute of Technology, Iizuka, Fukuoka 820-8502, Japan
*2 Research Center for Bio-microsensing Technology, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata, Kitakyushu, Fukuoka 804-8550, Japan
*3 Department of Applied Chemistry, Kyushu Institute of Technology, 1-1 Sensui-cho, Tobata, Kitakyushu, Fukuoka 804-8550, Japan
*4 Division of Periodontology, Department of Oral Function, Kyushu Dental University, Department of Oral Function, Kokura-kita, Kitakyushu, Fukuoka 803-8580, Japan
*5 Division of Infections and Molecular Biology, Department of Health Promotion, Kyushu Dental University, 2-6-1 Manazuru, Kokura-kita, Kitakyushu, Fukuoka 803-8580, Japan
Diagnosis of periodontal disease by Fourier transform infrared (FT-IR) microscopic technique was achieved for saliva samples. Twenty-two saliva samples, collected from 10 patients with periodontal disease and 12 normal volunteers, were pre-processed and analyzed by FT-IR microscopy. We found that the periodontal samples showed a larger raw IR spectrum than the control samples. In addition, the shape of the second derivative spectrum was clearly different between the periodontal and control samples. Furthermore, the amount of saliva content and the mixture ratio were different between the two samples. Partial least squares discriminant analysis was used for the discrimination of periodontal samples based on the second derivative spectrum. The leave-one-out cross-validation discrimination accuracy was 94.3%. Thus, these results show that periodontal disease may be diagnosed by analyzing saliva samples with FT-IR microscopy.