Analytical Sciences

Abstract − Analytical Sciences, 21(7), 827 (2005).

Determination of Trace Elements in Sediment Reference Materials by Monochromatic X-ray Excitation X-ray Fluorescence Spectrometry
Masayasu KURAHASHI, Jun MIZUTANI, and Akiharu HIOKI
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba 3-10, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan
A new reliable analytical method, “Monochromatic X-ray Excitation X-ray Fluorescence Spectrometry”, has been proposed. For validating the method, trace elements in sediment certified reference materials were determined. In the method X-ray fluorescence spectra are measured for specimens and pure metals; in addition the mass-attenuation coefficients of the specimens for various X-ray wavelengths are also measured. The data are analyzed by the fundamental parameter method and the uncertainty of the analysis is evaluated. The obtained results were in satisfactory agreement with the certified values within their uncertainties. This method will be applicable to the certification of reference materials, in the field of which reliable results with uncertainty statements are required.