Analytical Sciences

Abstract − Analytical Sciences, 17(1), 149 (2001).

X-ray Absorption Spectral Analyses by Theoretical Calculations for TiO2 and Ni-Doped TiO2 Thin Films on Glass Plates
Shuji MATSUO,*  Nahomi SAKAGUCHI,*1 Eiko OBUCHI,*2 Katsuyuki NAKANO,*2 Rupert C. C. PERERA,*3 Takashi WATANABE,*4 Taku MATSUO,*1 and Hisanobu WAKITA*1
*1 Department of Chemistry, Faculty of Science, Fukuoka University, Nanakuma, Jonan, Fukuoka 814-0180, Japan
*2 Department of Chemical Engineering, Faculty of Engineering, Fukuoka University, Nanakuma, Jonan, Fukuoka 814-0180, Japan
*3 Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
*4 KOBELCO Research Institute Inc., 1-5-5 Takatsukadai, Nishi, Kobe 651-2271, Japan
Ni L- and Ti L-edge as well as Ti K-edge X-ray absorption experiments for TiO2 thin films and Ni-doped TiO2 thin films coated on glass plates were performed using synchrotron radiation to investigate the structures around Ni and Ti ions in the films. The obtained spectra were compared with the results of theoretical calculations. It has consequently been found that the spectral features were affected by a change in the oxidizing form of Ni ions due to hydrogen reduction, by the charge variation and/or slight orbital splitting of Ti ions, and by the magnitude of the interaction between the center Ti ion and neighboring Ti ions.