Analytical Sciences

What's New

Feb. 10, 2010
Volume 26, Number 2 was released on the Web. Four Hot Articles of this month are highlighted.
Special Issue: Advances in Surface Chemical Analysis
—From Fundamentals to Standardization—

This special issue features six Reviews, thirteen Originals, and one Note. Four Rapid Communications are also available.

Please check the latest Instructions to Authors and Ethical Guidelines for Authors(Jan., 2010)

Cover illustration of this month "Si 1s spectra of SiO₂. The Structure is measured in angular mode by hard X-ray photoelectron spectroscopy (HXPS) system with monochromatic Cr K_α X-ray." by M. Kobata(p.227). See larger image
Jan. 10, 2010
Volume 26, Number 1 was released on the Web. Two Hot Articles of this month are highlighted. Volume 26, Number 1 was released on the Web. Two Hot Articles of this month are highlighted.
A Review Article of this month: "Recent Nanoarchitectures in Metal Nanoparticle-modified Electrodes for Electroanalysis" by M. OYAMA(p.1).
...Read more
Dec. 10, 2009
Volume 25, Number 12 was released on the Web. Three Hot Articles of this month are highlighted. Volume 25, Number 12 was released on the Web. Three Hot Articles of this month are highlighted.
This issue features two Rapid Communication, one Review, fifteen Originals, and four Notes.
...Read more
Nov. 10, 2009
Volume 25, Number 11 was released on the Web. Three Hot Articles of this month are highlighted. Volume 25, Number 11 was released on the Web. Three Hot Articles of this month are highlighted.
This issue features one Rapid Communication, one Review, thirteen Originals, and three Notes.
...Read more
Oct. 10, 2009
Volume 25, Number 10 was released on the Web. Two Hot Articles of this month are highlighted. Volume 25, Number 10 was released on the Web. Two Hot Articles of this month are highlighted.
Let's check the Photos of "POSTER PRESENTATION AWARDS AT ASIANALYSIS X" !...Read more

Recent 5 news are shown here. Show previous news.

Hot Articles − Volume 26, Number 2 (2010)

SERS Measurements of Magnetic Stretching Force-Induced Trans-Gauche Conformational Change

Takeyoshi GOTO et al. (Jump to p.135)

Conducting Polymer-coated Electrode as a Reference/Counter Electrode in an Organic Phase and Its Application to a Two-electrode Type Thin-layer Cell for Voltammetry at the Liquid | Liquid Interface

Yumi YOSHIDA et al. (Jump to p.137)

Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy

Mineharu SUZUKI et al. (Jump to p.203)

Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use

Masaaki KOBATA et al. (Jump to p.227)

Table of Contents − Volume 26, Number 2 (2010)

Rapid Communications

SERS Measurements of Magnetic Stretching Force-Induced Trans-Gauche Conformational Change

Takeyoshi GOTO and Hitoshi WATARAI

Analytical Sciences, 2010, 26(2), 135.

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Conducting Polymer-coated Electrode as a Reference/Counter Electrode in an Organic Phase and Its Application to a Two-electrode Type Thin-layer Cell for Voltammetry at the Liquid | Liquid Interface

Yumi YOSHIDA, Satoshi YAMAGUCHI, and Kohji MAEDA

Analytical Sciences, 2010, 26(2), 137.

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Fabrication of a Carbon Sphere-modified Electrode and Sensitive Determination of Cadmium(II)

Xiangliang NIE, and Weibing HU

Analytical Sciences, 2010, 26(2), 141.

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Simultaneous Injection-Effective Mixing Analysis of Palladium

Norio TESHIMA, Daisuke NOGUCHI, Yasutaka JOICHI, Narong LENGHOR, Noriko OHNO, Tadao SAKAI, and Shoji MOTOMIZU

Analytical Sciences, 2010, 26(2), 143.

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Special Issue: Advances in Surface Chemical Analysis
—From Fundamentals to Standardization—

Guest Editorial

Shigeo TAMURA

Analytical Sciences, 2010, 26(2), 145.

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Reviews

Introductory Photoemission Theory

Hiroko ARAI and Takashi FUJIKAWA

Analytical Sciences, 2010, 26(2), 147.

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Determination of Surface Composition by X-ray Photoelectron Spectroscopy Taking into Account Elastic Photoelectron Collisions

Aleksander JABLONSKI

Analytical Sciences, 2010, 26(2), 155.

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Surface Excitations in Surface Electron Spectroscopies Studied by Reflection Electron Energy-Loss Spectroscopy and Elastic Peak Electron Spectroscopy

Takaharu NAGATOMI and Shigeo TANUMA

Analytical Sciences, 2010, 26(2), 165.

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Electron Spectroscopy of Corrugated Solid Surfaces

J. ZEMEK

Analytical Sciences, 2010, 26(2), 177.

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Appearance Potential Spectroscopy (APS): Old Method, but Applicable to Study of Nano-structures

Y. FUKUDA

Analytical Sciences, 2010, 26(2), 187.

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ISO-Compliant Calibration of Energy and Intensity Scales of Electron Spectrometers

Kazuhiro YOSHIHARA

Analytical Sciences, 2010, 26(2), 199.

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Original Papers

Effects of Electron Back-scattering in Observations of Cross-sectioned GaAs/AlAs Superlattice with Auger Electron Spectroscopy

Mineharu SUZUKI, Nobuaki URUSHIHARA, Noriaki SANADA, Dennis F. PAUL, Scott BRYAN, and John S. HAMMOND

Analytical Sciences, 2010, 26(2), 203.

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Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy

Jirí PAVLUCH, Ludomir ZOMMER, Karel MAŠEK, Tomáš SKÁLA, František ŠUTARA, Václav NEHASIL, Igor PÍŠ, and Yaroslav POLYAK

Analytical Sciences, 2010, 26(2), 209.

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Electron Spectra Line Shape Analysis of Highly Oriented Pyrolytic Graphite and Nanocrystalline Diamond

Beata LESIAK, Josef ZEMEK, Jana HOUDKOVA, Alexander KROMKA, and Adam JÓZWIK

Analytical Sciences, 2010, 26(2), 217.

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Analysis of Ultra-Thin HfO₂/SiON/Si(001): Comparison of Three Different Techniques

Kenji KIMURA, Kaoru NAKAJIMA, Thierry CONARD, Wilfried VANDERVORST, Andreas BERGMAIER, and Günther DOLLINGER

Analytical Sciences, 2010, 26(2), 223.

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Development of the Hard-X-ray Angle Resolved X-ray Photoemission Spectrometer for Laboratory Use

Masaaki KOBATA, Igor PÍŠ, Hideo IWAI, Hiromichi YAMAZUI, Hiroaki TAKAHASHI, Mineharu SUZUKI, Hiroyuki MATSUDA, Hiroshi DAIMON, and Keisuke KOBAYASHI

Analytical Sciences, 2010, 26(2), 227.

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Contribution of Ni KLL Auger Electrons to the Probing Depth of the Conversion Electron Yield Measurements

Shinjiro HAYAKAWA, Aya TANAKA, and Takeshi HIROKAWA

Analytical Sciences, 2010, 26(2), 233.

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Remarks on Some Reference Materials for Applications in Elastic Peak Electron Spectroscopy

A. JABLONSKI and J. ZEMEK

Analytical Sciences, 2010, 26(2), 239.

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A Study of the Cascade Auger Process Using a Cluster Calculation

Sei FUKUSHIMA, and Satoshi OTA

Analytical Sciences, 2010, 26(2), 247.

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The Theoretical Study of Si Core Levels for the Change of Oxidation State

Sei FUKUSHIMA, and Satoshi OTA

Analytical Sciences, 2010, 26(2), 253.

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A Practical Method for Determining Minimum Detectable Values in Pulse-Counting Measurements

Yoichiro FURUKAWA, Manabu IWASAKI, and Akihiro TANAKA

Analytical Sciences, 2010, 26(2), 259.

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Structure of Ultra-Thin Diamond-Like Carbon Films Grown with Filtered Cathodic Arc on Si(001)

Alberto HERRERA-GOMEZ, Yongjian SUN, Francisco-Servando AGUIRRE-TOSTADO, Cherngye HWANG, Pierre-Giovanni MANI-GONZALEZ, Eric FLINT, Francisco ESPINOSA-MAGAÑA, and Robert M. WALLACE

Analytical Sciences, 2010, 26(2), 267.

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Evaluation of Outermost Surface Temperature of Silicon Substrates during UV-Excited Ozone Oxidation at Low Temperature

Naoto KAMEDA, Tetsuya NISHIGUCHI, Yoshiki MORIKAWA, Mitsuru KEKURA, Ken NAKAMURA, Tomoharu USHIYAMA, Hidehiko NONAKA, and Shingo ICHIMURA

Analytical Sciences, 2010, 26(2), 273.

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X-ray Fluorescence Analysis of Cr⁶⁺ Component in Mixtures of Cr₂O₃ and K₂CrO₄

Tatsunori TOCHIO, Shusuke SAKAKURA, Hirofumi OOHASHI, Hirohisa MIZOTA, Yanhui ZOU, Yoshiaki ITO, Sei FUKUSHIMA, Shigeo TANUMA, Takashi SHOJI, Hajime FUJIMURA, and Michiru YAMASHITA

Analytical Sciences, 2010, 26(2), 277.

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